CDM: SSC_350: Determining the measured value for Oi by conducting a survey of project devices in AMS-II.J

Your location: Home > Methodologies

03:51 02 Jul 25

Reference	SSC_350
Submitted by	Alexandre Marty, EDF Trading (21 Aug 09)
Request for revision	F-CDM-SSC-Subm (47 KB)
Annexes	Draft methodology with changes highlighted (83 KB)
Methodologies	AMS-II.J. ver. 3
Panel/WG meeting	Meth Panel 22 (21 Sep 09 - 24 Sep 09)
Final response	Final response (166 KB)
Historic statuses	No status history available

SSC_350: Determining the measured value for Oi by conducting a survey of project devices in AMS-II.J